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论文摘要

基于近红外光谱的小麦粉湿面筋含量检测

Detection of wet gluten content in wheat flour of near infrared spectroscopy

作者:胡玉君(北京工商大学计算机与信息工程学院);刘翠玲(北京工商大学计算机与信息工程学院);窦森磊(北京工商大学计算机与信息工程学院);孙晓荣(北京工商大学计算机与信息工程学院)

Author:HU Yu-Jun(Beijing Technology and Business University);LIU Cui-Ling(Beijing Technology and Business University);DOU Sen-Lei(Beijing Technology and Business University);SUN Xiao-Rong(Beijing Technology and Business University)

收稿日期:2014-09-26          年卷(期)页码:2015,52(4):800-804

期刊名称:四川大学学报: 自然科学版

Journal Name:Journal of Sichuan University (Natural Science Edition)

关键字:近红外光谱;湿面筋;偏最小二乘法

Key words:Near infrared spectroscopy; Wet gluten; Partial least square method

基金项目:北京市科技创新平台项目(pxm_2012_014213_000023);北京市教委科技发展重点项目(KZ201310011012);北京市优秀人才基金项目(2012D005003000007);北京市自然科学基金(4132008).

中文摘要

本文应用近红外光谱法测定小麦粉中湿面筋含量.对小麦粉的近红外光谱图进行消除常数偏移量、多元散射校正、减去一条直线三种预处理方法,用偏最小二乘法建立小麦粉的近红外光谱图与湿面筋含量之间的关系模型,并预测小麦粉中湿面筋含量.实验结果显示减去一条直线预处理后的模型评价指标最优,模型的相关系数R2为934,模型交互验证后的均方差为051,预测结果的均方根误差为0456.实验结果表明,近红外光谱法能够用于小麦粉湿面筋含量的测定

英文摘要

The paper uses Near Infrared Spectroscopy to detect the quality of wet gluten in wheat flour. Three pretreatments including eliminating the constant offset、multiplicative scatter correction and less a straight line are used to deal with the near infrared spectra,then create the related model between the near infrared spectrum of wheat flour and wet gluten content using the partial least squares method, then predict the wet gluten content in wheat flour. Experimental results show that the evaluation of model is optimal when using less a straight line to pretreat the near infrared spectrum,and the correlation coefficient R2 is 934 and the RMSECV is 051 after cross validation, the root mean square error of predicted results is 0456. Experimental results show that near infrared spectroscopy can be used to determine the quality of wheat flour gluten content.

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