模拟VLSI电路故障诊断的子带特征提取方法
Subband Signature Extraction for Fault Diagnosis ofAnalog VLSI Circuits
作者：谢永乐(电子科技大学 自动化工程学院,四川 成都 610054)；李西峰(电子科技大学 自动化工程学院,四川 成都 610054)
Author：(School of Automation Eng., Univ. of Electronic Sci. and Technol. of China，Chengdu 610054,China)；(School of Automation Eng., Univ. of Electronic Sci. and Technol. of China，Chengdu 610054,China)
收稿日期：2007-03-06 年卷（期）页码：2007,39(5):149-154
期刊名称：工程科学与技术
Journal Name：Advanced Engineering Sciences
关键字：模拟电路测试;故障诊断;小波滤波器组;相关系数;特征提取
Key words：testing of analog circuits;fault diagnosis;wavelet filter bank;correlation coefficient;signature extraction
基金项目：国家自然科学基金资助项目（90407007）
中文摘要
为了降低模拟电路参数型故障的测试难度，提出了一种基于奥克塔夫（Octave） Haar小波结构的模拟VLSI电路故障诊断方法。将测试响应经小波滤波器组完成子带滤波，随后对各子带滤波序列计算故障子序列与正常子序列的互相关系数, 对每一故障，可确定出互相关系数最小的子带,并将此数值作为该故障的特征, 对应子带的正常响应序列的自相关系数作为无故障特征，用故障特征与正常特征的对比可诊断故障。对国际标准电路的实验表明,该方法对参数型故障的诊断已具有高分辨率。
英文摘要
An approach for diagnosing analog VLSI circuits based on Octave Haar wavelet was presented in order to lower the difficulty level of testing analog parametric fault. Sub-band filtering of testing response signal was accomplished by wavelet filter banks. The cross-correlation coefficient(CCC) was computed to sequence acquired from sub-band filtering. Consequently, for each fault, subband with lowest CCC value was determined and this value could be used as faulty signature for this fault, and auto-correlation coefficient of normal response in corresponding sub-band was referred to as fault-free signature. Hence, fault diagnosis can be finished by comparing the faulty signature with its fault-free counterpart. Experiments of international Benchmark circuit showed that methodology had high precision for diagnosing parametric fault.
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